Hi,
I am trying to simulate normal incidence of 200eV-4keV electrons hitting a tungsten target and measuring the SEY and BEY. I am using the updated MicroElecPhysics.cc list which has been extended for materials including W. However, i am overproducing secondaries by a factor of 2,does anyone know what processes may be causing this in the physics list? My detector construction and stepping function is shown below:
construction.cc (2.8 KB)
Stepping.cc (3.3 KB)