At present, I have a problem: a beam of low-energy Ag ions bombards the stainless steel plate at a certain speed.
Ag ions in the bombardment will continue to sputter and bounce out, and some Ag ions are injected into stainless steel and internal atoms and electrons collide, inducing many electrons to escape out, electrons are negatively charged, which will affect the incident ion beam and affect the sputtering efficiency. In the process of ion-matter interaction, due to the electron energy loss and nuclear energy loss, the target atom is excited and ionized, and the kinetic energy of the energy-carrying ion is continuously reduced. Some of these excited ionized target electrons eventually leave the sample surface to form emission, a phenomenon called secondary electron emission, and the emitted electrons are secondary electrons.
I now want to use simulation software to calculate how many electrons escape. At present, I don’t know how to set the silver ion beam? What is the right physical process?
Currently the physical process ：FTFP_BERT_HP
Current ion beam：
if (fParticleGun->GetParticleDefinition() == G4Geantino::Geantino()) {
G4int Z = 47, A = 108;
G4double ionCharge = 1 * eplus;
G4double excitEnergy = 0 * keV;
G4ParticleDefinition* Ag = G4IonTable::GetIonTable()->GetIon(Z, A, excitEnergy);
fParticleGun->SetParticleDefinition(Ag);
fParticleGun->SetParticleCharge(ionCharge);
}